- Introduction
- C&W in Electronic Manufacturing and First Level Interconnects
- The C&W Assembly Process
- Basic Requirements
- Critical Factors
- Cleaning
- Die Bonding
- Eutectic/Adhesive
- Wire Bonding
- High Yield Wire Bonding
- Bondable Metals
- Plated Metals
- Insuring Bondability
- The Bonding Wire
- Au, Al, Cu
- Bonding Wire Methods
- Thermosonic/Ultrasonic/Thermosonic
- The Automatic Wire Bonder
- Responding to New Packaging and Assembly Technologies
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- Evaluating Wire Bonding
- Wire Pull Testing
- Ball Shear
- Destructive Pull Testing
- Non-Destructive Pull Testing
- Critiquing Test Results - Pull Strengths and Failure Modes
- Wire Bonding for COB Applications
- Organic substrates
- Wire Bonding Problems
- Successful Wire Bonding
- Alternatives: Tape Automated Bonding, Flip Chip
- Wafer Bumping
- Device Bumping
- Tape Manufacturing
- TAB Bonding/Assembly
- Flip Chip Assembly
- In Summary
- Semiconductor, Hybrids and COB assembly -
“The Name of the Game”
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