WHAT THE COURSE COVERS:

• Intro to Test
• The Bottom Line / Basic Terms / Binning
• Environmental Testing / Voltage Stress
• What is the Correct Way to Test? / Defects
• What will be Tested? / Program Flow
• Test System Architecture
• Basic Terms / The Test System / What’s in a Test System?
• Control Functions / DC Instrumentation
• Mechanical / Software / Basic Guidelines of Test Engineering
• Functional/AC Instrumentation
• Device Specifications
• Basic Terms / The Design Specification
• The Test Specification / Logical Functions
• The Device Specification
• Device Specifications and Test Conditions
• Test Conditions and Limits
• Parameters that Apply to DC Parametric
• Testing / 256 x 4 RAM Specifications
• Interpreting the Device Specification
• Parameters that Apply to Functional and AC Testing
• Reading Device Specifications
• Opens and Shorts – PMU Method
• Why Test for Opens and Shorts? / Datalogs & Troubleshooting
• Opens and Shorts Serial Static Method
• Verifying DC Parameters
• Basic Terms
• DC Tests and the Hidden Resistance
• Ohm’s Law, how it relates to DC testing
• VOH/IOH and VOL/IOL / Input Clamp
• IDD Gross Current
• IDD Static Current and IDDQ Current
• IDD Dynamic Current
• High Impedance Currents (IOZL/IOZH)
• Resistive Inputs Pull-ups and Pull-downs
• Input Currents (IIL/IIH)
• Output Short Circuit Current (IOS)
• Functional Testing
• Introduction to Functional Testing
• Functional Subsystem / The Test Cycle
• Input Data and Input Signal Formats
• Developing Input Signal Timings
• Output Data and Testing Outputs
• Testing Valid (L/H) Output Levels

• Output Testing using an Edge/Window Strobe
• Testing High Impedance Output Levels
• Output Current Loading
• Developing Output Strobe Timing
• Output Loading for AC Tests / Vector Data
• Functional Specifications
• Gross Functional Tests / Functional Z State
• Equation Based Timing / Open Drain
• Open Source Outputs
• Functionally Testing a Device
• Opens & Shorts – Functional Method
• VIL/VIH Input Levels Testing
• VOL/IOL VOH/IOH Functional Test
• Resistive Output Loading
• Input/Output Levels Relationship
• High Impedance Testing
• Testing AC Parameters
• AC Parametric Testing / Compromises / Rise Time / Fall Time
• Read & Record and Go-Nogo Testing / Standard AC Parameters
• Output Enable and Disable Time / Write Cycle Timing
• Developing Functional Timing / Read Cycle Timing
• Setup Time / Hold Time / Propagation Delay Measurement
• Minimum Pulse Widths / Maximum Frequency
• AC Specifications from 256 x 4 Static RAM Data Sheet
• Design for Testability
• Design for Testability and Functional Testing / Fault Models
• Fault Coverage / Stuck-At Fault Analysis / What is DFT?
• Scan Design / Boundary Scan IEEE 1149.1 / BIST
• Boundary Scan Architecture / DFT Considerations
• Boundary Scan Register Functions
• Boundary Scan Register Logic
• Device Characterization
• Overview / Test Vectors and Characterization / Linear Search
• Defining Characterization Parameters / Binary Search
• Shmoo Plots
• Common Characterization Parameters / Use of Test System Tools
• Test System Datalogger / Binary Search – Input Timings
• Binary Search – Output Timings / Threshold/Level Search
• Troubleshooting
• Examples / datalogs
• Debug Tools and Techniques