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Dr. Paul Tobias currently offers consulting and training services for industrial clients.
He retired from International SEMATECH, a semiconductor manufacturing research consortium, after managing the Statistical Methods Group for
9 years.
After receiving his PhD. in Mathematical Statistics from Columbia University, he spent 25 years as a statistician and manager at IBM’s semiconductor facility in East Fishkill, New York. During those years his primary focus was on modeling and projecting field
reliability for new integrated circuit technologies and setting up field return and failure analysis monitoring systems.
Dr. Tobias has published over 40 technical reports and journal articles and he is the co-author of the textbook "Applied Reliability", now in its 2nd edition. He was the co-editor for the creation of the on-line NIST/SEMATECH e-Handbook of Statistical Methods. In addition, he has chaired several International Semiconductor Standards Task Forces that added statistical methodology to the E10 Equipment Reliability Standard and created a new Standard for Measurement Capability Analysis, E89. He currently holds the position of Technical Editor for the Semiconductor Equipment and Materials International Organization (SEMI ) Metrics Committee and he is the Treasurer for the annual American Statistical Association Quality and Productivity Research Conference.
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