Testing RF Wireless Fundamentals

The purpose of this course is to introduce the terminology, concepts, and techniques associated with testing RF semiconductor circuits. The course begins by discussing RF components, moves to transmission line theory, and then concentrates on RF test concepts. Many digital and mixed signal engineers are now faced with the task of testing integrated RF, Microwave, and Wireless circuits. This course is designed to jump-start your understanding of RF terminology, components, test hardware, and test methodologies.

This and and all other courses are available for On Site Training

WHAT THE COURSE COVERS:
    Intro - RF Terminology
  • Freespace wavelength / Intercept Point
  • The Electromagnetic Spectrum / IP 3 / IF
  • Microwave Spectrum / Bandwidth / Channel
  • Noise Floor / Pad / EMI / Dynamic Range
  • Digital Modulation & Distortion / Impedance
  • Frequency Modulation and Accuracy
  • Types of Signal Modulation / THD / VSWR
  • Harmonic Signals / Wireless Standards
  • Network Analyzer / Small Signal Gain
  • Spurious-Free Dynamic Range
  • FFT/ DSP / LNA / BPF / LPF / HPF
  • Down-converter / Conversion Loss
  • Decibels / Linear / Logarithmic
  • DB / dBc / dBm / P1dB / S/N / SNR
  • Isolation / Isolators / Noise Figure


    • RF Components
  • Connectors / N / BNC / SMA / SMB/ SMC, SSMA / OSSM / BMA / OSP / OSSP
  • 3.5 and 1mm Connectors
  • Spectrum Analyzer
  • Terminators and Attenuators
  • Directional Couplers / Coupling Factor / Power Divider


    • Generic RF Device Models
  • RF Circuitry / Transmit Path – modulator and VGA
  • Receive Path – low noise amplifier / mixer


    • Transmission Line Theory and S-Parameter
  • Wave Analogy / Impedance
  • Transmission Line Termination
  • High Frequency Device Characterization
  • Standing Wave Ration / S-Parameters
  • Forward and Reverse Measurements
  • Reflection Coefficient / Return Loss
  • Scalar Transmission Measurements
  • Scalar Reflection Measurements
    Smith Chart Concepts
  • Overview of Smith Charts / Groups
  • Normalized / Impedance


    • RF Test Concepts
  • Time Domain / Combining Sine Waves / Power Gain
  • Measurement Setups / Low-Noise Amplifier
  • Gain Measurements / Frequency Synthesizers
  • Amplifier Compression / P1dB Measurement
  • Common Types of Noise / Noise Figures
  • Phase Noise / Phase Relationships / Signal Matching
  • Power Spectral Density / VCO Measurements
  • Distortion and Mixer Measurements
  • Intermodulation Distortion / Third Order Intercept
  • Converters and Tuners / Measuring ACPR
  • Down-converting Mixer Measurements
  • Adjacent Channel Power Ration (ACPR)


    • RF Device Functionality Concepts –
  • SOC – Increasing Levels of Integration
  • Block Diagram / Typical Test List / What is WLAN
  • Bluetooth Transmitter / Receiver Tests
  • Bluetooth ATE Tester Requirements / Bit Error Rate
  • Time Domain / Synthesizer Lock / Bandwidth
  • WLAN Standard / WLAN and Cellular
  • WLAN ATE test requirements / Test Parameters
  • Key Features / Measurements–802.11a and 802.111b


    • Modulation
  • Wireless Communications / Transmitting / Modulation
  • Fundamentals / Demodulation Error Quantities
  • Frequency Errors / Amplitude Droop
  • Magnitude and Phase Errors – Making the Measurements


  • DUT Board Design, Fixturing and De-embedding
  • Fixturing Considerations / Test Head Fixtures
  • DUT Interface Fixtures / DUT Board Design Criteria
  • Materials and Board Fabrication / Contactors / Calibration
  • De-embedding / Standard Calibration vs. De-embedding

WHO SHOULD ATTEND?
  • Test and Product Engineers
  • Engineering Managers
  • Field Service Engineers
  • Maintenance Technicians
  • Sales Engineers
"We Exceed Your Expectations!"

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