X-Ray Photoelectron Spectroscopy (XPS / ESCA)

XPS is used to determine the atoms present at a surface and their concentrations, chemistry, and lateral and depth distributions. This course emphasizes the topics listed below over a 2 day presentation.

This and all other courses are available as On Site Training


WHAT THE COURSE COVERS:
  • Introduction
  • Terminology
  • Surfaces
  • Types of Surfaces
  • The Principles of XPS
  • Production of Photoelectrons
  • Peak Labeling
  • Electronic Figuration of Atoms
  • Atoms
  • Molecules
  • Solids
  • Energy
  • Spectra
  • Auger Process
  • Valence Spectra
  • Surface Sensitivity
  • Information Depth
  • Sample Handling
  • Spin-Orbit Splitting
  • Chemical Shift
  • Plasmons
  • Multiplet Splitting
  • Shake-up
  • Instrumentation
  • Dual Anode
  • Bremsstrahlung
  • Monochromatic Source
  • Electron Energy Analyzers
  • Spectrum Acquisition
  • Energy Resolution
  • Scattering in Analyzers
  • Electron Detectors
  • Pulse Counting
  • Position Sensitive Detectors
  • Small Area Analysis
  • Area Location
  • Imaging XPS
  • Methods
  • Equipment and Examples
  • Vacuum System Samples
  • Energy Scale Calibration
  • Qualitative Analysis
  • Identification of Elements
  • Changing X-Ray sources
  • Charging
  • Interpretation of Chemical Shift
  • Relaxation Effects
  • Auger Parameter
  • Peak Widths
  • Lineshapes
  • Quantitative Analysis
  • Sensitivity Factors
  • Ionization Cross Section
  • Asymmetry Parameter
  • Analyzer Transmission
  • Reference Spectra
  • Intensities
  • Background Subtraction
  • Detection Limit
  • Effect of Thin Overlayers
  • Artifacts
  • X-Ray Damage
  • Charging
  • Methods for Charge Control
  • Ghost Peaks
  • Data Acquisition and Processing
  • Processing Data
  • Tougaard Background Subtraction
  • Satellite Subtraction
  • Peak Area
  • Lineshapes
  • Curve Fitting
  • Deconvolution
  • Depth Profiling
  • Non-Destructive and Destructive Methods
  • Angle Resolved XPS
  • Diffraction
  • Elastic Scattering
  • Thickogram
  • Inelastic Loss Method
  • Sputtering
  • Depth Calibration
  • Applications
  • Instrument Selection and Summary

    • WHO SHOULD ATTEND?
    • Scientists
    • Engineers
    • Technicians
    • and Students who would like a detailed understanding of the use of x-ray photoelectron spectroscopy (XPS/ESCA) for surface analysis
    This course includes a copy of the course notes.

    INSTRUCTOR:

    Dr. John Grant has extensive experience in the field of surface science, having worked in this area for over 35 years. He is an expert with the techniques used in such studies and has extensive experience in Auger electron spectroscopy (AES), x-ray photoelectron spectroscopy (XPS or ESCA), ion bombardment of solids, sputter depth profiling, ion scattering spectroscopy (ISS), secondary ion mass spectroscopy (SIMS), scanning electron microscopy (SEM), low energy electron diffraction (LEED), ionization loss spectroscopy, soft x-ray appearance potential spectroscopy (APS), surface conductivity, surface photovoltaic effects, gas adsorption and desorption, electron beam interactions with solid surfaces, surface cleaning procedures, ultrahigh vacuum techniques, specimen preparation techniques, and controlled cleavage or fracture of specimens. He has worked with polymers, metals, semiconductors, and insulators. Dr. Grant has worked in this field in Australia, Europe, and the United States and is an internationally-recognized authority in the field of surface science. He is currently conducting research on optical coatings and nanomaterials.


    "We Exceed Your Expectations!"

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