This 2 day course outlines the steps to be taken to maximize the probability of successful design of an Application Specific Integrated Circuit (ASIC) design. We explain the differences between the basic ASIC architectures, such as Standard Cell, Gate Arrays, and FPGAs. We will then examine specific design issues that can cause failures along with techniques to avoid them, including design-for-test (DFT) methods, simulation , and overall procedures for testing the chip at final test..
What the Course Covers:
What is the definition of an ASIC device?
ASIC Architectures – Standard Cell, Gate Array, FPGAs,
Design Techniques and Issues
Design for Testability
Who Should Attend:
Anyone wanting an understanding of ASIC design
Next Schedule Date and Location:
Only offer at clients' site
$12,900 USD for 14 students)
Contact us if interested in an on site training program