This 2 day course outlines the steps to be taken to maximize the probability of successful design of  an Application Specific Integrated Circuit (ASIC) design. We explain the differences  between the basic ASIC architectures, such as Standard Cell, Gate Arrays, and FPGAs. We will then examine specific design issues that can cause failures along with techniques to avoid them, including design-for-test (DFT) methods, simulation , and overall procedures for testing the chip at final test..

What the Course Covers:

What is the definition of an ASIC device?
ASIC Architectures – Standard Cell, Gate Array, FPGAs,
Design Techniques and Issues
Synchronous Design
Design for Testability
Simulation 
Testing