This three day course is designed to provide practical and physical understanding of VLSI devices and technology. It is intended to give the participants insights into the physics of semiconductor devices, characterization techniques and device technology. The emphasis will be on the problems (and solutions) of CMOS devices when they are scaled to deep-submicron regime. This course is designed to enable the students to: (1) Refresh the physics and design of submicron devices with the emphasis on reliability issues. (2) Review various potential high-field effects due to device scaling (e.g. hot-carrier degradation). (3) Determine the advantages as well as shortcomings of various submicron device structures and processes. (4) Characterize these devices for both fundamental understanding and reliability evaluation.
What the Course Covers:
Who Should Attend:
Engineers, Technicians and Managers who want to refresh their understanding of the physics and technology of submicron CMOS devices.
The course will give the students insights into various potential problems of ultra-small devices and ways to minimize these detrimental effects. Some basic knowledge of semiconductor device operation is assumed.
Next Schedule Date and Location:
Only offer at clients' site
$18,900 USD for up to 14 students
Contact us if interested in an on site training program