Definition
Highly accelerated stress test (HAST) is an accelerated temperature-and-humidity reliability test, commonly performed with pressure and often electrical bias, that rapidly stresses packaged semiconductor devices against moisture-related failure mechanisms.
Application
HAST/BHAST is used in semiconductor qualification to accelerate corrosion, ionic contamination, package moisture, and related reliability failures under high temperature and humidity.
Related search terms
highly accelerated temperature and humidity stress test
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Related concepts
Evidence and further reading
- Evidence from docs.amd.comhttps://docs.amd.com/r/en-US/ug116/Highly-Accelerated-Temperature-and-Humidity-Stress-Test
- Evidence from ti.comhttps://www.ti.com/quality-reliability/reliability/testing.html