Definition
An approach to manufacturing that integrates connected systems, operational data and analysis so production can respond to changing conditions and demands in real time.
Application
In semiconductor fabs, supports process control, equipment-fault detection, yield analysis and wafer-defect inspection.
Related concepts
Evidence and further reading
- Evidence from nist.govhttps://www.nist.gov/programs-projects/smart-manufacturing-operations-planning-and-control-program
- Evidence from investor.tsmc.comhttps://investor.tsmc.com/static/annualReports/2025/english/pdf/2025_tsmc_ar_e_ch5.pdf