Definition
A non-destructive corruption of stored data or circuit state caused by a transient disturbance, such as energetic-particle radiation or electrical noise, rather than permanent hardware failure.
Application
Evaluated in memory and logic reliability analysis to select suitable error detection, correction and recovery measures, including memory scrubbing.
Related concepts
Evidence and further reading
- Evidence from ti.comhttps://www.ti.com/quality-reliability/faqs.html
- Evidence from tmo.jpl.nasa.govhttps://tmo.jpl.nasa.gov/progress_report/42-181/181A.pdf