Definition
The measurement and analysis of a semiconductor material's or device's electrical response using techniques such as current-voltage, capacitance-voltage, pulsed, leakage and reliability measurements.
Application
Used to extract and monitor parameters such as threshold voltage, capacitance, leakage, carrier mobility, interface behavior and breakdown, supporting device development, process optimization, qualification and parametric control.
Related search terms
Semiconductor electrical characterization; device electrical characterization
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Related concepts
Evidence and further reading
- Evidence from keysight.comhttps://www.keysight.com/us/en/products/semiconductors.html
- Evidence from tek.comhttps://www.tek.com/en/documents/brochure/simplifying-mosfet-and-moscap-device-characterization-e-guide