Failure Rate

13 Test, Reliability, Yield & Failure Analysis

Notation λ

Definition

Failure rate is the rate or conditional frequency at which devices in a population fail over time or use under stated conditions, commonly denoted by λ and expressed in units such as failures per device-hour or failures in time (FIT).

Application

Semiconductor reliability programs use failure rate to quantify field or accelerated-test reliability, compare technologies or lots, and support lifetime and qualification decisions; the rate may vary across early-life, useful-life, and wear-out regions.

Related search terms

Fail rate; hazard rate; FIT rate

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Related concepts

Evidence and further reading

  • Evidence from ti.comhttps://www.ti.com/quality-reliability/reliability/terminology.html
  • Evidence from fda.govhttps://www.fda.gov/inspections-compliance-enforcement-and-criminal-investigations/inspection-technical-guides/reliability-manufactured-products