Definition
A reliability test in which components are operated under elevated stress so failures occur sooner, allowing models to project lifetime or failure behavior at normal use conditions.
Application
Used for semiconductor qualification and reliability modeling with stresses such as temperature, voltage, current or humidity, while avoiding stress levels that introduce unrealistic failure mechanisms.
Related search terms
Accelerated life testing
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Related concepts
Evidence and further reading
- Evidence from itl.nist.govhttps://www.itl.nist.gov/div898/handbook/apr/section3/apr314.htm
- Evidence from ti.comhttps://www.ti.com/quality-reliability/reliability/testing.html