Definition
High-temperature operating life (HTOL) is an accelerated semiconductor reliability test in which powered devices operate for an extended time at elevated junction temperature, often with voltage stress.
Application
HTOL is used to accelerate time-dependent failure mechanisms, estimate long-term device reliability or FIT rates, and qualify semiconductor products under standards such as JESD22-A108.
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high temperature operating life
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Evidence and further reading
- Evidence from ti.comhttps://www.ti.com/quality-reliability/reliability/testing.html
- Evidence from docs.amd.comhttps://docs.amd.com/r/en-US/ug116/High-Temperature-Operating-Life-HTOL-Test