Definition
A semiconductor screening or reliability test in which devices are operated or electrically stressed, usually at elevated temperature, for a defined time to accelerate early-life failures or reveal marginal units.
Application
Used for pre-shipment screening of semiconductor devices, including memory and automotive ICs, to identify units susceptible to early-life failures.
Related search terms
Burn-in test; BI (informal/common shorthand)
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Related concepts
Evidence and further reading
- Evidence from advantest.comhttps://www.advantest.com/en/products/semiconductor-test-system/memory/b6700/
- Evidence from amkor.comhttps://amkor.com/test-services/