Qualification

13 Test, Reliability, Yield & Failure Analysis

Definition

Qualification is the defined set of evaluations and accelerated stress tests used to demonstrate that a semiconductor product, process, package, or manufacturing change meets specified quality and reliability requirements before release or acceptance.

Application

Used before production release and after significant changes to establish reliability confidence under standardized stress conditions such as temperature, humidity, voltage, cycling, and operating-life tests, commonly following JEDEC-based qualification plans.

Related search terms

Product qualification; Reliability qualification

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Related concepts

Evidence and further reading

  • Evidence from ti.comhttps://www.ti.com/quality-reliability/reliability/testing.html
  • Evidence from infineon.comhttps://www.infineon.com/de/gated/infineon-infineon-s70fl01gsagmfv010-pqr-v-03-01-en-productqualificationreport_5711fdf2-b8ff-4014-8ff3-4f21922aa48c