Definition
A temperature-acceleration model for thermally activated processes in which reaction or failure rate changes exponentially with inverse absolute temperature and an activation-energy parameter.
Application
Used in semiconductor reliability and process engineering to estimate acceleration factors, extrapolate lifetime from elevated-temperature tests, and model diffusion, migration or reaction-driven mechanisms.
Related search terms
Arrhenius acceleration model; Arrhenius equation
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Related concepts
Evidence and further reading
- Evidence from itl.nist.govhttps://itl.nist.gov/div898/handbook/apr/section1/apr151.htm
- Evidence from itl.nist.govhttps://www.itl.nist.gov/div898/handbook/apr/section3/apr314.htm