Definition
Hot carrier injection (HCI) is a semiconductor degradation mechanism in which carriers gain high kinetic energy in strong electric fields and some enter dielectric or interface regions, creating trapped charge or interface damage.
Application
HCI is evaluated in transistor reliability because accumulated damage can shift threshold voltage, reduce drive current, and degrade circuit lifetime, especially in high-field MOS operation.
Related search terms
hot carrier degradation
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Evidence and further reading
- Evidence from docs.lib.purdue.eduhttps://docs.lib.purdue.edu/dissertations/AAI3307398/
- Evidence from escholarship.orghttps://escholarship.org/content/qt9pv711jz/qt9pv711jz_noSplash_c3a0057e16bcd837d2769d7591e8e146.pdf