Definition
An interface trap is an electrically active defect state at or near an interface, such as a semiconductor/dielectric boundary, that can capture and emit charge carriers.
Application
Interface traps are characterized to understand mobility loss, threshold shifts, charge trapping, noise, and reliability in MOS and other semiconductor devices.
Related search terms
interface state; interfacial trap
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Related concepts
Evidence and further reading
- Evidence from nist.govhttps://www.nist.gov/publications/characterization-silicon-dioxide-silicon-interface-scanning-capacitance-microscope
- Evidence from nist.govhttps://www.nist.gov/publications/impact-near-interface-defects-no-annealed-sic-mosfet-mobility