Definition
A radiation-induced change in a device’s stored state caused by one energetic-particle event, potentially affecting one or multiple bits; the upset can remain until the state is rewritten or reset.
Application
Evaluated in radiation-reliability testing and system design to estimate upset rates and choose suitable hardening, error-correction and recovery measures for memory and logic.
Related concepts
Evidence and further reading
- Evidence from ntrs.nasa.govhttps://ntrs.nasa.gov/api/citations/20230004376/downloads/20230004376.pdf
- Evidence from parts.jpl.nasa.govhttps://parts.jpl.nasa.gov/asic/Sect.3.4.html