Automatic Test Equipment

Definition

Programmable semiconductor test equipment that applies controlled electrical stimuli to a device and measures its responses against expected limits or test patterns.

Application

Used at wafer sort and packaged-device test for functional, parametric, memory, mixed-signal, RF and power testing, helping separate passing devices from defective devices and generate production test data.

Related concepts

• Wafer Sort
• Final Test
• Functional Test
• Parametric Test

Evidence and further reading

• Evidence from advantest.comhttps://www.advantest.com/en/semiconductor-basics/automated-test-equipment/
• Evidence from advantest.comhttps://www.advantest.com/en/products/semiconductor-test-system/