Definition
A localized defect or electronic state in a semiconductor or dielectric that can capture an electron for a finite time and later release it.
Application
Electron trapping is monitored as a reliability and variability mechanism in scaled devices, while engineered charge-trap memory intentionally stores electrons in trapping layers to represent nonvolatile data.
Related search terms
Electron trapping center; electron trap state
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Related concepts
Evidence and further reading
- Evidence from nist.govhttps://www.nist.gov/news-events/news/2017/11/new-insights-captured-electrons-could-improve-flash-memory
- Evidence from semiconductor.samsung.comhttps://semiconductor.samsung.com/news-events/tech-blog/all-there-is-to-know-about-flash-memory-how-no1-flash-memory-came-about/