Definition
Failure analysis is the systematic investigation of a failed semiconductor device, package, structure, or test result to identify the physical or electrical failure mode and determine the underlying root cause or contributing mechanisms.
Application
Semiconductor failure analysis combines electrical characterization with physical inspection and material/structural analysis to localize defects, distinguish competing failure modes, and feed corrective action back into design, process, packaging, or reliability controls.
Related search terms
Semiconductor failure analysis; device failure analysis
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Related concepts
Evidence and further reading
- Evidence from nist.govhttps://www.nist.gov/publications/detailed-failure-analysis-examination-effect-thermal-cycling-cu-tsv-reliability
- Evidence from nist.govhttps://www.nist.gov/publications/reliability-and-characterization-challenges-nano-scale-electronic-devices