Definition
A failure mechanism is the physical, chemical, electrical, mechanical, or materials process that produces degradation or failure in a semiconductor device or package, such as void growth, dielectric breakdown, electromigration, or fatigue.
Application
Reliability engineers identify failure mechanisms so stress tests and process changes target the actual degradation physics rather than only the observed symptom; mechanism knowledge supports lifetime modeling and corrective action.
Related search terms
Physical failure mechanism; degradation mechanism
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Related concepts
Evidence and further reading
- Evidence from nist.govhttps://www.nist.gov/publications/reliability-and-characterization-challenges-nano-scale-electronic-devices
- Evidence from nist.govhttps://www.nist.gov/publications/detailed-failure-analysis-examination-effect-thermal-cycling-cu-tsv-reliability