Definition
The angle of a patterned feature’s sidewall relative to a stated reference plane; with the wafer-surface plane as the reference, a vertical sidewall is 90°.
Application
Used to quantify etch-profile taper and compare process conditions when controlling semiconductor feature shape.
Related concepts
Evidence and further reading
- Evidence from pages.nist.govhttps://pages.nist.gov/SCATMECH/docs/grating.htm
- Evidence from ctcms.nist.govhttps://www.ctcms.nist.gov/~davydov/12Para_GaN%20pillars_JVST.pdf