Definition
Statistical analysis that fits a Weibull probability distribution to failure data and assesses whether the model describes the data adequately.
Application
Used to estimate failure fractions from semiconductor-package reliability tests, such as temperature cycling of flip-chip ball-grid-array assemblies.
Related concepts
Evidence and further reading
- Evidence from itl.nist.govhttps://www.itl.nist.gov/div898/handbook/eda/section3/edav.htm
- Evidence from ti.comhttps://www.ti.com/lit/wp/spry319/spry319.pdf