Definition
Coordinated collection and analysis of manufacturing and test data to identify, correct, and monitor sources of semiconductor yield loss.
Application
Used to detect process excursions, guide corrective actions, and check whether yield-limiting problems remain contained.
Related concepts
Evidence and further reading
- Evidence from ir.kla.comhttps://ir.kla.com/sec-filings/annual-reports/content/0000891618-99-004364/0000891618-99-004364.pdf
- Evidence from news.synopsys.comhttps://news.synopsys.com/home?item=123387