Definition
The fraction of units in a defined semiconductor production or test population that meet the applicable acceptance requirements.
Application
Used to quantify good output and compare manufacturing performance, including wafer-completion and electrical die-sort results.
Related concepts
Evidence and further reading
- Evidence from semiconductor.samsung.comhttps://semiconductor.samsung.com/support/tools-resources/dictionary/semiconductor-glossary-yield/
- Evidence from ieor.berkeley.eduhttps://ieor.berkeley.edu/wp-content/uploads/2019/10/CSM-52.pdf