Definition
The predicted fraction of dies that remain functional when yield loss is modeled from physical manufacturing defects, separate from parametric or other nondefect yield mechanisms.
Application
Used with defect-density and critical-area information to estimate how random opens, shorts, via or contact failures reduce good-die yield. Poisson, negative-binomial or related statistical yield models translate defect exposure into defect-limited yield.
Related search terms
Random-defect-limited yield; defect yield
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Related concepts
Evidence and further reading
- Evidence from semiconductors.orghttps://www.semiconductors.org/wp-content/uploads/2018/08/2007Yield.pdf
- Evidence from siemens.comhttps://www.siemens.com/en-us/products/ic/calibre-design/design-for-manufacturing/yield-analyzer/