Definition
The process of using fabrication and test evidence to identify yield-limiting failures and guide corrective changes.
Application
Used during semiconductor process or product development to locate failing circuits and prioritize process or design fixes.
Related concepts
Evidence and further reading
- Evidence from research.ibm.comhttps://research.ibm.com/publications/ring-oscillator-yield-learning-methodologies-for-cmos-technology-research
- Evidence from news.synopsys.comhttps://news.synopsys.com/home?item=123387