Extreme Ultraviolet Lithography

05 Lithography & Mask Technology

Notation EUV

Definition

Extreme ultraviolet lithography (EUV lithography) is a semiconductor patterning technology that uses approximately 13.5 nm wavelength light and reflective optics to image very small features from a reflective mask onto photoresist-coated wafers.

Application

EUV reduces the need for some multi-patterning sequences at advanced logic and memory nodes and is used to print critical layers where shorter wavelength and high numerical aperture improve achievable resolution and patterning complexity.

Related search terms

EUV lithography; EUVL

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