Definition
A probe card is an electromechanical interface that uses precision probes to contact pads or bumps on semiconductor die and connect them to test equipment, typically while the devices are on a wafer and, in some configurations, after die singulation.
Application
Used during wafer probe and wafer sort to make temporary electrical contact between the tester and one or more die for parametric and functional testing before packaging.
Related search terms
Wafer probe card; Test probe card
Search phrases help you find this entry; their meaning depends on the context shown here.
Related concepts
Evidence and further reading
- Evidence from technoprobe.comhttps://www.technoprobe.com/it/tecnologie-e-prodotti/probe-cards
- Evidence from formfactor.comhttps://www.formfactor.com/product/probe-cards/foundry-logic/truescale/