Definition
A probe station is a manual or automated platform that positions electrical probes on wafer or device contact pads so semiconductor structures can be electrically measured under controlled mechanical, thermal, or environmental conditions.
Application
Used for wafer-level device characterization, parametric testing, model extraction, R&D, and failure analysis before packaging; probe manipulators, stages, shielding, and temperature control support repeatable I-V, C-V, RF, and related measurements.
Related search terms
Wafer probe station; Semiconductor probe station
Search phrases help you find this entry; their meaning depends on the context shown here.
Related concepts
Evidence and further reading
- Evidence from formfactor.comhttps://www.formfactor.com/product/probe-systems/200-mm-systems/summit200/
- Evidence from signatone.comhttps://signatone.com/