Definition
Electron microscopy that forms images of internal structure using electrons transmitted through an electron-transparent specimen.
Application
Used to examine semiconductor layer thicknesses, interfaces and crystal defects.
Related concepts
Evidence and further reading
- Evidence from jeolusa.comhttps://www.jeolusa.com/RESOURCES/Electron-Optics/transmission-electron-microscopy
- Evidence from ctcms.nist.govhttps://www.ctcms.nist.gov/~davydov/05Levi_ZnO%20NW%20TEM_APL_87_103110.pdf