Definition
Design-for-test circuitry integrated into a chip or IP block that generates test stimuli, evaluates responses or signatures, and reports test results with reduced dependence on external pattern generation.
Application
Used for manufacturing test, power-on or in-field diagnostics and functional-safety monitoring of logic, memories and interfaces; specialized forms include LBIST and MBIST.
Related search terms
Built-in self test; logic BIST; memory BIST (specific forms)
Search phrases help you find this entry; their meaning depends on the context shown here.
Related concepts
Evidence and further reading
- Evidence from synopsys.comhttps://www.synopsys.com/implementation-and-signoff/test-automation/testmax-xlbist.html
- Evidence from synopsys.comhttps://www.synopsys.com/implementation-and-signoff/test-automation/synopsys-ip-sms.html