Chemical Mechanical Planarization

08 Wet Processing, Cleaning & CMP

Notation CMP

Definition

A wafer planarization process that combines chemically assisted surface reactions with mechanical polishing by a pad and slurry to remove material and produce a flatter, more uniform surface.

Application

Used repeatedly in logic, memory and advanced packaging to planarize dielectrics, metals and other films, enabling subsequent lithography and multilayer integration while controlling thickness and within-wafer uniformity.

Related search terms

Chemical mechanical polishing (common synonym)

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Related concepts

Evidence and further reading