Contact Etch Stop Layer

09 FEOL Devices & Advanced Transistors

Notation CESL

Definition

A dielectric layer, commonly a nitride-based film, placed over transistor structures to provide a selective stopping or control layer during etching of the overlying interlayer dielectric for contact formation.

Application

Used to protect gates, source/drain regions and isolation structures during contact-hole etch and, in some device generations, also to introduce tensile or compressive stress that modifies channel mobility.

Related search terms

Contact etch-stop film; contact etch stop

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Related concepts

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