Silicon Nitride

07 Deposition, Epitaxy & Thin Films

Notation Si3N4 (stoichiometric); SiNx (variable composition)

Definition

A silicon–nitrogen dielectric used as a thin film in semiconductor processing; stoichiometric material is Si3N4, while deposited films can be nonstoichiometric SiNx.

Application

Used as an electrical insulator in gate structures and as a surface-passivation coating on semiconductor devices.

Related concepts

Evidence and further reading