Definition
A manufacturing-derived geometric or patterning constraint that an IC layout must satisfy, such as minimum width, spacing, enclosure, overlap or density requirements for a specific process technology.
Application
Encoded in foundry rule decks and PDKs and used during layout and physical verification to keep geometry within manufacturable limits; advanced nodes add context-dependent and pattern-based constraints beyond simple minimum dimensions.
Related search terms
Layout design rule; foundry design rule
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Related concepts
Evidence and further reading
- Evidence from blogs.sw.siemens.comhttps://blogs.sw.siemens.com/calibre/2025/10/30/design-rule-checking-guide/
- Evidence from siemens.comhttps://www.siemens.com/en-us/products/ic/calibre-design/physical-verification/design-rule-checking/