Definition
Failure analysis that uses electrical measurements and fault-localization techniques to isolate abnormal circuit behavior and narrow a semiconductor failure to a device, interconnect or physical region.
Application
Used to localize opens, shorts, leakage, power and timing-related failures with methods such as electrical probing, electron-beam probing and thermal or optical fault isolation before targeted physical failure analysis.
Related search terms
Electrical fault isolation; electrical failure localization
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Related concepts
Evidence and further reading
- Evidence from thermofisher.comhttps://www.thermofisher.com/in/en/home/semiconductors/advanced-logic-devices/applications/semiconductor-failure-analysis.html
- Evidence from thermofisher.comhttps://www.thermofisher.com/in/en/home/electron-microscopy/products/electrical-failure-analysis-systems/meridian/instruments/meridian-ex.html